| |
item |
specification |
test method |
| temp. compensating type |
high dielectric constant type |
| 1 |
operating temperature range |
np0: -55 to 125 degree c |
x7r: -55 to 125 degree c
x5r: -55 to 85 degree c
y5v: -30 to 85 degree c
|
|
| 2 |
rated voltage |
4vdc, 6.3vdc, 10vdc, 16vdc, 25vdc, 35vdc, 50vdc, 100vdc, 200vdc, 250vdc, 500vdc, 630vdc, 1000vdc, 2000vdc, 3000vdc |
the rated voltage is defined as the maximum voltage, which may be applied continuously to the capacitor. |
| 3 |
appearance |
no defects or abnormalities. |
visual inspection |
| 4 |
dimensions |
within the specified dimension. |
using calipers |
| 5 |
dielectric strength |
no defects or abnormalities. |
no failure shall be observed when 250%* of the rated voltage ( 150% for 500v, 120% for above 1kv ) is applied between the terminations for 1 to 5 seconds. the charge and discharge current is less than 50ma. |
| 6 |
insulation resistance(i.r.) |
| rated voltage: <500v |
to apply rated voltage. |
i.r. ≧10g or ricr≧500ω-f
(whichever is smaller)
|
| rated voltage: ≧500v |
to apply 500v. |
|
the insulation resistance shall be measured with a dc voltage not exceeding the rated voltage at 25℃ and 75%rh max, and within 1 minute of charging. |
| 7 |
capacitance |
within the specified tolerance
* x7r, x5r and y5v at 1000 hours
|
the capacitance / d.f. shall be measured at 25°c at the frequency and voltage shown in the tables.
| item |
class i
c≦1,000pf |
class ii
>1,000pf |
* class ii |
| frequency |
1.0±0.2mhz |
1.0±0.2khz |
1.0±0.2khz |
| voltage |
1.0±0.2vrms |
1.0±0.2vrms |
1.0±0.2vrms |
* for capacitance>10uf, the measure frequency is 120hz /-10% and voltage 0.5 /-1vrms. |
| 8 |
q/dissipation factor(d.f.) |
np0:
if c≦30pf, df≦1/(400 20c), c in pf
if c >30pf, df≦0.1%.
|
i. x5r, x7r:
see x5r,x7r df table
ii. y5v:
see y5v df table.
|
| 9 |
capacitance temperature characteristics |
capacitance change
npo within 0±30ppm/℃ under operating temperature range.
|
capacitance change
x7r/x5r within ±15%
y5v: -82 to 22% |
1. temperature compensating type:
the capacitance value at 25℃ and 85℃ shall be measured and calculated from the formula given below.
t.c.=(c85-c25)/c25*△t*106(ppm/℃)
2.high dielectric constant type:
the ranges of capacitance change compared with the 25℃ value over the temperature ranges shall be within the specified ranges. |
| 10 |
termination strength |
no removal of the terminations or marking defect. |
apply a parallel force of 5n to a pcb mounted sample for 10±1sec. *2n for 0603 (eia 0201). |
| 11 |
deflection(bending strength) |
no cracking or marking defects shall occur at 1mm deflection.
capacitance change:
npo: within ±5% or ± 0.5pf. (whichever is larger)
x7r, x5r:within ±12.5%
y5v: within ±20%
|
solder the capacitor to the test jig(glass epoxy boards) shown in fig.a using a eutectic solder(then let sit for 48±4 hours for x7r x5r and y5v).
then apply a force in the direction shown in fig.b. the soldering shall be done with the reflow method and shall uniform and free of defects such as heat shock. |
| size |
a |
b |
c |
| 0603 |
0.3 |
0.9 |
0.3 |
| 1005 |
0.4 |
1.5 |
0.5 |
| 1608 |
1.0 |
3.0 |
1.2 |
| 2012 |
1.2 |
4.0 |
1.65 |
| 3216 |
2.2 |
5.0 |
2.0 |
| 4520 |
3.5 |
7.0 |
2.5 |
| 4532 |
3.5 |
7.0 |
3.7 |
|
 |
|
| 12 |
solderability of termination |
90% of the terminations are to be soldered evenly and continuously. |
immerse the test capacitor into a methanol solution containing rosin for 3 to 5 seconds, preheat it 150 to 180℃ for 2 to 3 minutes and immerse it into sn-3.0ag-0.5cu solder of 245 ± 5℃ for 3±1seconds. |
| 13 |
resistance to soldering heat |
appearance |
no marking defects |
*preheat the capacitor at 120 to 150℃ for 1 minute.
immerse the capacitor in a sac305(sn96.5ag3.0cu0.5) ?solder solution at 270±5℃ for 10±1 seconds. let sit at room temperature for 24±2 hours (temperature compensating type) or 48±4 hours (high dielectric constant type), then measure.
*preheat at 150 to 200℃ for size ≧ 3216.
*high dielectric constant type: initial measurement: perform a heat treatment at 150 /-10℃ for one hour and then let sit for 48±4hours at room temperature. perform the initial measurement. |
| cap. change |
np0 within ±2.5% or 0.25pf ( whichever is larger ) |
x7r/x5r within ±7.5%
y5v within ±20%
|
| q/d.f. |
if c≦30pf, df≦1/(400 20c)
if c >30pf, df≦0.1%
|
to satisfy the specified initial spec. |
| i.r. |
i.r.≧10,000mw or ricr≧500w-f.
(whichever is smaller)
|
i.r.≧10,000mw or ricr≧500w-f.
(whichever is smaller)
|
| 14 |
temperature cycle(thermal shock) |
appearance |
no marking defects |
solder the capacitor to supporting jig (glass epoxy board) and perform the five cycles according to the four heat treatments listed in the following table. let sit for 24±2hrs at room temperature, then measure.
step 1: minimum operating temperature
|
30±3min |
| step 2: room temperature |
2~3min |
| step 3: maximum operating temperature |
30±3min |
| step 4: room temperature |
2~3min |
*high dielectric constant type: initial measurement: perform a heat treatment at 150 /-10℃ for an hour and then let sit for 48±4 hours at room temp. perform the initial measurement. |
| cap. change |
np0 within ±2.5% or 0.25pf ( whichever is larger ) |
x7r/x5r within ±7.5%
y5v within ±20%
|
| q/d.f. |
if c≦30pf, df≦1/(400 20c)
if c >30pf, df≦0.1%
|
to satisfy the specified initial spec. |
| i.r. |
i.r.≧10,000mw or ricr≧500w-f.
(whichever is smaller)
|
i.r.≧10,000mw or ricr≧500w-f.
(whichever is smaller)
|
| 15 |
humidity load |
appearance |
no marking defects |
apply the rated voltage at 40±2℃ and 90 to 95% humidity for 500±12 hours. remove and let sit for 24±2 hours (temperature compensating type) or 48±4 hours (high dielectric constant type) at room temperature, then measure.
the charge / discharge current is less than 50ma.
pre-treatment: apply the rated dc voltage for 1 hr at 40±2℃ and 90 to 95% humidity. remove and let sit for 48±4 hours, then perform the initial measurement.
initial measurement for high dielectric type. apply the rated dc voltage for 1 hour at 40±2℃. remove and let sit for 48±4 hours at room temperature then perform initial measurement. |
| cap. change |
np0 within ±7.5% or 0.75pf
( whichever is larger ) |
x7r/x5r within ±12.5%
y5v within ±30%
|
| q/d.f. |
if＞30pf, df≦0.5%
if c≦30pf,d≦1/(100 10xc/3) c in pf
|
x7r 200% max of initial spec.
y5v 150% max of initial spec.
x5r 200% max of initial spec.
|
| i.r. |
i.r.≧500mw or ricr≧25w-f.
(whichever is smaller)
|
i.r.≧500mw or ricr≧25w-f.
(whichever is smaller)
|
| 16 |
high temperature load life test |
appearance |
no marking defects |
apply 200%(150% for≧500v; 120% for≧1000v) of the rated voltage for 1000±12 hours at the maximum operating temperature ± 3℃. let sit for 24± 2 hours (temperature compensating type) or 48±4 hours (high dielectric constant type) at room temperature, then measure.
the charge/discharge current is less than 50ma.
p.s.: please refer to table 1 for items applying 150% voltage.
pre-treatment:
apply 200%* of the rated voltage for 1 hr at maximum operating temperature ±3℃. remove and let sit for 48±4 hours, then perform the initial measurement.
* 150% for high dielectric constant type≧500v.
* 120% for voltage ≧ 1000v.
* some of the parts are applicable in rated voltage *1.5. please
refer to table 1
|
| cap. change |
np0 within±7.5% or 0.75pf
(whichever is large) |
x7r/x5r within±12.5%
y5v within±30% |
| q/d.f. |
if c>30pf,df≦0.3%
if 10pf
if c≦10pf, df≦1/(200 10c), c in pf |
x7r 200% max of initial spec.
y5v 150% max of initial spec.
x5r 200% max of initial spec. |
| i.r. |
more than 1gω or ricr≧50ω-f
(whichever is less.) |
more than 1gω or ricr≧50ω-f
(whichever is less.) |
